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先﨑 純寿 研究室
Showing the original Japanese · View translation
パワー半導体の結晶欠陥と寿命の関係をデータで解き明かす研究室。
AboutAbout the lab
欠陥を測って理解し、安心して使える半導体へ。
先﨑研究室は、
最先端の
研究は、
大学院から
Key terms
- パワー半導体
- 電気
自動車の インバータや 鉄道車両の 電力変換装置、 再生可能エネルギー用の パワーコンディショナ、 5G基地局などで 実用化が 進んでいる 半導体 - SiC
- 炭化ケイ素。
GaN （窒化ガリウム）と 並ぶ、 次世代パワー半導体の 代表的な 材料 - 結晶
欠陥 - 半導体ウェハの
内部に 存在する 欠陥。 デバイスの 歩留まり 低下や、 長く 使ううちの 信頼性の 劣化を 引き起こす
ResearchResearch themes
次世代パワー半導体の
欠陥と劣化をつなぐデータベース
ウェハ品質、
*Illustrative imageウェハ品質から歩留まりを読む解析
デバイス試作の
*Illustrative image劣化の仕組みに基づく寿命予測
次世代パワー半導体デバイスに
MembersFaculty
- Affiliated Professor先﨑 純寿
VoicesStudent voices
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Report an errorAbout the images
The top and research theme images are illustrative and were not taken at the lab. They are cropped from Wikimedia Commons images. Cropped CC BY-SA images are provided under the same CC BY-SA license as the original (version shown on each line).
- Top image: “Emerson Network Power 7001232-J200 - National Semiconductor LM340T5-93496” Raimond Spekking / CC BY-SA 4.0 (cropped)
- ウェハ品質から
歩留まりを 読む解析: “Wafer 20110212” Sangitiana Fararano / CC BY-SA 2.0 (cropped) - 劣化の
仕組みに 基づく 寿命予測: “MITSUBISHI IGBT module” Sthdhk / CC BY-SA 4.0 (cropped) - Related lab (横川 慎二 研究室): “Coin cells being tested” UCL Faculty of Mathematical and Physical Sciences / CC BY 3.0 (cropped)
- Related lab (李 傲寒 研究室): “D-Wave-Washington-1000Q” Mwjohnson0 / CC BY-SA 4.0 (cropped)
- Related lab (戸田 貴久 研究室): “Zoox Toyota Highlander Test Vehicle - San Francisco, May 2025 08” 9yz / CC BY 4.0 (cropped)
- Related lab (金 路 研究室): “Steel Bridge Inspection - Snooper truck” Oregon Department of Transportation / CC BY 4.0 (cropped)
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