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Electron Microscopy Theory Lab [Research Center for Ultrahigh Voltage Electron Microscopy]
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The lab pioneers measurement techniques for electron microscopy.

AboutAbout the lab
Visualizing the invisible fine world with electron microscopes.
The lab develops measurement methods and techniques for electron microscopes, which visualize the invisible fine world at the micron, nano, and atomic scales.
It uses a variety of state-of-the-art electron microscopes, including the 3-million-volt ultrahigh-voltage electron microscope, which has the highest accelerating voltage in the world.
The lab works on methods for precisely measuring ultrafine materials in three dimensions and on establishing new lensless nanoimaging methods.
It is a research division of the Research Center for Ultrahigh Voltage Electron Microscopy, and in the graduate school it is a cooperating research group of the Division of Electrical, Electronic and Infocommunications Engineering, Graduate School of Engineering.
Key terms
- Ultrahigh-voltage electron microscope
- An electron microscope with an especially high accelerating voltage. This lab uses a 3-million-volt instrument, which has the highest accelerating voltage in the world.
- Nanoimaging
- A method for producing images of nanoscale structures. This lab works on establishing a new method that does not use lenses.
- Aberration correction
- A technique that compensates for imperfections in lenses. This lab works on applying it to the measurement of device materials.
ResearchResearch themes
The lab develops various methods and techniques that push forward the frontier of electron microscope measurement for observing the fine world at the micron, nano, and atomic scales. It conducts research using a range of state-of-the-art electron microscopes, including the 3-million-volt ultrahigh-voltage electron microscope, which has the highest accelerating voltage in the world.
View More ↗MembersFaculty
- ProfessorJun Yamasaki
- Assistant ProfessorHiroshi Nakajima
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Report an errorAbout the images
The top and research theme images are illustrative and were not taken at the lab. They are cropped from Wikimedia Commons images. Cropped CC BY-SA images are provided under the same CC BY-SA license as the original (version shown on each line).
- Top image: “JEOL JEM-200A transmission electron microscope -08” High Contrast / CC BY 3.0 de (cropped)
- Development of methods and techniques for electron microscope measurement: “Electron microscope-CNAM 43819” Antoaneta from Paris, France / CC BY 2.0 (cropped)
- Related lab (Terahertz Science Lab [Institute of Laser Engineering]): “ESA laser testing ESA372639” European Space Agency / CC BY-SA 3.0 igo (cropped)
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