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固体量子物性工学
Showing the original Japanese · View translation
電子のスピンを操って、消費電力の少ないデバイスを。

AboutAbout the lab
電子のスピンで、新しいデバイスを。
固体量子物性工学研究室
量子力学、
研究成果は
Key terms
- スピントロニクス
- 電子の
電荷だけでなく、 スピン (小さな 磁石の 性質)も 使う 電子工学 - 純スピン流
- 電荷の
流れを ともな わずに、 スピンだけが 流れる 現象 - スピン軌道相互作用
- 電子の
スピンと、 電子の 運動とが 結びつく、 固体の 中の 相対論的な 効果
ResearchResearch themes
IV族半導体の
*Illustrative imageシリコンでスピンを使う
シリコン、
*Illustrative imageエネルギーを失わないスピンの流れ
電荷の
*Illustrative image熱でスピンの流れをつくる
熱で
*Illustrative image相対論とトポロジーを生かす
固体中の
MembersFaculty
固体量子物性工学研究室の
- Professor白石 誠司
- Associate ProfessorPUEBLA Jorge
- Associate Professor大島 諒
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Write a lab reviewAnonymous · Your draft is saved if you stopRelatedLabs similar to 固体量子物性工学
電子材料物性工学工学部 電気電子工学科ナノレベルでの
光機能デバイス工学工学部 電気電子工学科私たちの
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量子電磁工学工学部 電気電子工学科原子のThe information on this page is compiled by the LabLog team from the lab's public information and interviews. For corrections or removal requests, please contact LabLog, not the lab.
Report an errorAbout the images
The top and research theme images are illustrative and were not taken at the lab. They are cropped from Wikimedia Commons images. Cropped CC BY-SA images are provided under the same CC BY-SA license as the original (version shown on each line).
- Top image: “MTJ with Transparent Background” OJB Quantum / CC BY 4.0 (cropped)
- シリコンで
スピンを 使う : “IMaGe 31072R – Silicon Wafer 20120926” Rob Bulmahn / CC BY 2.0 (cropped) - エネルギーを
失わない スピンの 流れ: “Spintronic Devices ( )” National Institute of Standards and Technology / Public domain (cropped) - 熱で
スピンの 流れを つくる : “Thermoelectric Seebeck power module” Gerardtv / CC BY-SA 3.0 (cropped) - 相対論と
トポロジーを 生かす: “Bismuth crystal pyramid” Imunarriz / CC BY-SA 3.0 (cropped) - Related lab (電子材料物性工学): “AFM-Raman-TERS” AAMonitor96 / CC BY-SA 3.0 (cropped)
- Related lab (光機能デバイス工学): “Blue led 09 of 10” Renato.pierri / CC BY-SA 4.0 (cropped)
- Related lab (ナノプロセス工学): “Microscopy Lab Tour at the Colorado School of Mines” SparkFun Electronics from Boulder, USA / CC BY 2.0 (cropped)
- Related lab (量子電磁工学): “17jila003 3d strontium atomic clock” National Institute of Standards and Technology / Public domain (cropped)
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