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高橋・道畑研究室
Showing the original Japanese · View translation
“光”でつくり、“光”でみる、超精密ものづくりの研究室。
AboutAbout the lab
“光”でつくる、“光”でみる。
高橋・
製造の
回折限界を
新しい
Key terms
- 回折限界
- 光が
波と して 広がる ため、 ふつうの 顕微鏡では 波長の およそ半分より 小さい ものを 見分けられないと いう 限界 - インプロセス計測
- 加工が
終わってから 測るのではなく、 加工している 最中に、 その場で 形や 表面の 状態を 測る こと - 光コム
- 色
（周波数）の 違う 光が、 くしの 歯のように 等しい 間隔で 並んだ光。 長さなどを 正確に 測る ものさしに なる
NewsLab news
修士課程の
学生が、 型技術協会学生優秀研究発表賞を 受賞 修士課程の
学生が、 ICW 2026で Outstanding Awardを 受賞 2色の
蛍光で 表面形状を 測る 論文が 学術誌に 採択 微小球の
直径を 測る 論文が Precision Engineering誌に 採択 道畑准教授が、
ISNM Excellent Scientist Awardを 受賞
ResearchResearch themes
次世代の
*Illustrative image回折限界を超えるセンシング
狭い
*Illustrative image加工中の表面をナノの精度で測る
超
*Illustrative image半導体のナノ欠陥を光で見つける
半導体の
*Illustrative image光コムを使った高精度センサ
光コムと
MembersFaculty
高橋・
- Professor高橋 哲Publications ↗
- Associate Professor道畑 正岐Publications ↗
- Assistant Professor増井 周造Publications ↗
VoicesStudent voices
Compiled from answers by students who were in the lab. Ratings and reviews reflect individual students' experiences, not the lab's official views.
Students who take part in an interview may receive a thank-you gift worth ¥1,000, regardless of what they say.
Who is this lab for?
What's great about this lab?
What did you learn after joining?
What's the vibe, and what is the professor like?
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RelatedLabs similar to 高橋・道畑研究室
The information on this page is compiled by the LabLog team from the lab's public information and interviews. For corrections or removal requests, please contact LabLog, not the lab.
Report an errorAbout the images
The top and research theme images are illustrative and were not taken at the lab. They are cropped from Wikimedia Commons images. Cropped CC BY-SA images are provided under the same CC BY-SA license as the original (version shown on each line).
- Top image: “Mechanical delay stage in an optical setup 01” Aksy88 / CC BY-SA 4.0 (cropped)
- 回折限界を
超える センシング: “Evanescent wave cropped” Aluminium (adapted by Gavin R Putland). / CC BY-SA 3.0 (cropped) - 加工中の
表面を ナノの 精度で 測る : “Bauteil Laserpoliert” Bestemrc / CC BY-SA 4.0 (cropped) - 半導体の
ナノ欠陥を 光で 見つける : “Semiconductor Wafer of Microelectronics” DrHughManning / CC BY-SA 4.0 (cropped) - 光コムを
使った 高精度センサ: “Laser frequency comb installed on HARPS” ESO / CC BY 4.0 (cropped) - Related lab (三村・細畠研究室): “SPring- img pano” en:User:Artorius / CC BY-SA 3.0 (cropped)
- Related lab (新野研究室): “Laser Sintering - Entnahme eines Modell aus dem Baumaterial” i.materialise（YouTube） / CC BY-SA 3.0 (cropped)
- Related lab (音響創成工学研究室): “Levitación acústica” Richard Haberkern / CC BY-SA 4.0 (cropped)
- Related lab (川勝研究室): “Atomic force microscope” Johannes Schneider / CC BY-SA 4.0 (cropped)
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