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Takahashi-Michihata Lab
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An ultra-precision manufacturing lab that creates with light and sees with light.
AboutAbout the lab
Creating with light, seeing with light
The Takahashi-Michihata Lab researches ultra-precision nanofabrication and measurement technologies that use light.
In addition to the light long used on manufacturing floors, the lab also uses light localized in a very small region, such as evanescent light and near-field light, to explore the potential of light to support next-generation manufacturing.
The lab's work is wide-ranging, from fundamental research on light beyond the diffraction limit to applied research on practical implementation that meets industry needs.
The lab also proposes the Cell-in-Micro-Factory, a new production framework for microdevices.
Key terms
- Diffraction limit
- A limit that arises because light spreads as a wave: an ordinary microscope cannot distinguish features smaller than about half the wavelength.
- In-process measurement
- Measuring shape or surface condition on the spot while machining is under way, rather than after it is finished.
- Optical frequency comb
- Light in which different colors (frequencies) are lined up at equal intervals like the teeth of a comb. It serves as an accurate ruler for measuring length and other quantities.
NewsLab news
A master's student received the Student Excellent Research Presentation Award from the Die and Mold Technology Association
A master's student received an Outstanding Award at ICW 2026
A paper on measuring surface shape using two-color fluorescence was accepted by an academic journal
A paper on measuring the diameter of microspheres was accepted by Precision Engineering
Associate Professor Michihata received the ISNM Excellent Scientist Award
ResearchResearch themes
To realize next-generation ultra-precision manufacturing, the lab studies new micro- and nanoscale fabrication, measurement, and production technologies that use light energy. Alongside laser-based nanofabrication and nano in-process measurement technologies, the lab aims to establish the Cell-in-Micro-Factory, a new concept for production systems.
*Illustrative imageSensing beyond the diffraction limit
The lab studies sensing beyond the diffraction limit, long regarded as the limit of light, by controlling light localized in a very small region (localized photons) with high precision.
*Illustrative imageMeasuring surfaces at nanometer precision during machining
The lab develops nano in-process measurement technology that uses localized photons to measure the condition of ultra-precision machined surfaces while machining is under way.
*Illustrative imageFinding nanoscale defects in semiconductors with light
The lab develops methods that use light to measure nanometer-sized defects arising in semiconductor manufacturing with high sensitivity and resolution.
*Illustrative imageHigh-precision sensors using optical frequency combs
The lab develops next-generation high-precision sensors that use an optical frequency comb as the light source. It also works on high-precision three-dimensional measurement using optical frequency combs.
MembersFaculty
The Takahashi-Michihata Lab consists of faculty members, visiting researchers, project researchers, secretaries, and doctoral, master's, and undergraduate students.As of 2026
- ProfessorSatoru TakahashiPublications ↗
- Associate ProfessorMasaki MichihataPublications ↗
- Assistant ProfessorShuzo MasuiPublications ↗
VoicesStudent voices
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Report an errorAbout the images
The top and research theme images are illustrative and were not taken at the lab. They are cropped from Wikimedia Commons images. Cropped CC BY-SA images are provided under the same CC BY-SA license as the original (version shown on each line).
- Top image: “Mechanical delay stage in an optical setup 01” Aksy88 / CC BY-SA 4.0 (cropped)
- Sensing beyond the diffraction limit: “Evanescent wave cropped” Aluminium (adapted by Gavin R Putland). / CC BY-SA 3.0 (cropped)
- Measuring surfaces at nanometer precision during machining: “Bauteil Laserpoliert” Bestemrc / CC BY-SA 4.0 (cropped)
- Finding nanoscale defects in semiconductors with light: “Semiconductor Wafer of Microelectronics” DrHughManning / CC BY-SA 4.0 (cropped)
- High-precision sensors using optical frequency combs: “Laser frequency comb installed on HARPS” ESO / CC BY 4.0 (cropped)
- Related lab (Mimura-Hosobata Lab): “SPring- img pano” en:User:Artorius / CC BY-SA 3.0 (cropped)
- Related lab (Niino Lab): “Laser Sintering - Entnahme eines Modell aus dem Baumaterial” i.materialise（YouTube） / CC BY-SA 3.0 (cropped)
- Related lab (Morita-Imashiro Lab): “Levitación acústica” Richard Haberkern / CC BY-SA 4.0 (cropped)
- Related lab (Kawakatsu Lab): “Atomic force microscope” Johannes Schneider / CC BY-SA 4.0 (cropped)
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