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Nojima Lab
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A lab for materials fabrication and measurement that develops ion beams selected by element and probes stress at material interfaces.
AboutAbout the lab
Honing the technologies of materials fabrication and measurement.
The Nojima Lab studies materials fabrication using ion beams, as well as measurement techniques for investigating the local stress properties of materials.
The lab's introduction states, "Without innovation in fabrication and measurement technology, there is no cutting-edge research."
The lab is developing a mass spectrometer based on a new principle, the rotating electric field mass spectrometer, and is working on selecting a target element and forming it into an ion beam.
The lab also evaluates the mechanism of initial fracture in carbon fiber composites and the interfacial strength of semiconductor encapsulation packages.
Key terms
- Rotating electric field mass spectrometer
- A device that separates ions by mass using a rotating electric field (REF-MS). It is developed in the lab
- Electrospray ionization
- A method of turning an element into ions from a solution containing any desired element (ESI)
- Focused ion beam
- An ion beam narrowed to a fine point (FIB). The lab uses it for the microsampling method
- Carbon fiber composite
- A composite material made with carbon fiber (CFRP). The lab studies the mechanism of its initial fracture
ResearchResearch themes
The Nojima Lab aims for innovation in the technologies of fabrication and measurement themselves. It works on producing element-selected ion beams with a rotating electric field mass spectrometer (REF-MS), and on investigating the stress properties at material interfaces using the microsampling method.
Ion Beams Selected by Element
Ions are produced by electrospray ionization from a solution containing any desired element, and the target element is selected with a rotating electric field mass spectrometer. The lab aims to use element-selected ion beams for materials fabrication.
Visualizing Stress at Material Interfaces
Using the focused ion beam (FIB) microsampling method, the lab reveals the local stress properties at the interfaces between different materials. It evaluates the mechanism of initial fracture in carbon fiber composites (CFRP) and the interfacial strength of semiconductor encapsulation packages.
MembersFaculty
- LecturerMasashi Nojima
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The top and research theme images are illustrative and were not taken at the lab. They are cropped from Wikimedia Commons images. Cropped CC BY-SA images are provided under the same CC BY-SA license as the original (version shown on each line).
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