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Nanomaterials and Device Science Lab
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The lab uses electron microscopy to observe changes in materials in situ at the nanoscale.

AboutAbout the lab
Watching nanoscale changes inside an electron microscope
The Nanomaterials and Device Science Lab uses electron beams to observe, at the nanometer scale, the arrangement of the atoms and microstructures that make up a specimen.
Its research centers on "in situ observation," in which changes in microstructure, functions, and mechanical properties are watched in real time while heat, light, external force, and other stimuli are applied.
By combining this with data science and computational methods, the lab aims to establish microscopy techniques that can be used to explore unknown materials and evaluate their functions.
On the lab's website, the lab is introduced under the name "Murayama Lab."
Key terms
- In situ observation
- A technique for observing changes in a material in real time while applying heat, light, external force, and other stimuli
- Electron microscope
- An instrument that uses an electron beam as a probe to observe the arrangement of the atoms and microstructures that make up a specimen
- Cathodoluminescence
- A technique, used together with an electron microscope, for examining the light emitted by luminescent materials with nanoscale spatial resolution
NewsLab news
Paper published in Micron
Associate Professor Saito established the Nanostructure Engineering group as an independent Associate Professor
Authored Section 9 of the book "Degradation and Fracture Evaluation and Lifetime Prediction Using AI and Simulation"
ResearchResearch themes
The lab's research centers on in situ observation: applying heat, light, external force, and other stimuli to specimens inside an electron microscope and observing changes in microstructure, functions, and mechanical properties in real time. By combining this approach with data science and computational methods, the lab works to establish microscopy analysis methods that can be used to explore unknown materials and evaluate their functions, and to elucidate physical and chemical phenomena.
*Illustrative imageElectron microscopy integrated with machine learning
The lab aims to establish next-generation microscopy analysis methods that combine data science and computational methods with electron microscopy analysis of microstructures and local chemical composition. It also conducts research and education to understand the relationship between microstructure and functional and mechanical properties.
*Illustrative imageMeasuring interactions between resonators and emitters
The lab investigates interactions between resonators and emitters (light-emitting objects) using nanoscale optical measurements. The keywords are cathodoluminescence, nanophotonic cavities, and electron energy-loss spectroscopy.
MembersFaculty
The members of the Nanomaterials and Device Science Lab consist of a Professor (cross-appointment), an Assistant Professor, technical staff, and doctoral students.As of 2026
- Professor (Cross-appointment)Mitsuhiro Murayama
- Associate ProfessorHikaru Saito
- Assistant ProfessorShiro Ihara
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Report an errorAbout the images
The top and research theme images are illustrative and were not taken at the lab. They are cropped from Wikimedia Commons images. Cropped CC BY-SA images are provided under the same CC BY-SA license as the original (version shown on each line).
- Top image: “Transmission electron microscope (Morgagni 268D) 4pl” Pleple2000 / CC BY-SA 3.0 (cropped)
- Electron microscopy integrated with machine learning: “Transmission electron microscope (2)” Gannu03 / CC BY-SA 4.0 (cropped)
- Measuring interactions between resonators and emitters: “InGaN crystal SEM+CL” FDominec / CC BY 4.0 (cropped)
- Related lab (先進ナノマテリアル科学研究室): “Neon atoms between graphene sheets ( )” Oak Ridge National Laboratory / CC BY 2.0 (cropped)
- Related lab (材料構造制御学研究室): “Pyrope crystal structure” Kent G. Budge / CC BY-SA 4.0 (cropped)
- Related lab (ナノ構造解析学研究室): “Morpho helena wing detail” OKJaguar / CC BY-SA 4.0 (cropped)
- Related lab (分子計測学研究室): “SpectroscopyResearch 027” National Institute of Standards and Technology / Public domain (cropped)
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